Current sensing completion detection in dual-rail asynchronous systems

This paper addresses a novel methodology of detecting the completion of computation process of the combinatorial block in asynchronous systems. Logic gates fabricated in CMOS technology draw electrical current in several orders of magnitude higher during the signal transitions than in the idle state. This fact can be used to separate the idle state and the computing activity. The paper presents the fundamental background of the completion methodology, detailed explanation of the sensing circuitry operation, achieved simulation results as well as the comparison to state-of-the-art methods of completion detection.

[1]  I. I. Shagurin,et al.  Physical approach to CMOS module self-timing , 1990 .

[2]  Phillip E. Allen,et al.  A low-voltage, bulk-driven MOSFET current mirror for CMOS technology , 1995, Proceedings of ISCAS'95 - International Symposium on Circuits and Systems.

[3]  Olli Vainio,et al.  Current-sensing completion detection method for standard cell based digital system design , 2002, 2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353).

[4]  Olli Vainio,et al.  Dynamically biased current sensor for current-sensing completion detection , 2001, ISCAS 2001. The 2001 IEEE International Symposium on Circuits and Systems (Cat. No.01CH37196).

[5]  Eckhard Grass,et al.  Asynchronous circuits based on multiple localised current-sensing completion detection , 1995, Proceedings Second Working Conference on Asynchronous Design Methodologies.

[6]  Feng Shi,et al.  A transistor-level test strategy for C/sup 2/MOS MOUSETRAP asynchronous pipelines , 2006, 12th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC'06).

[7]  J. Cortadella,et al.  Methodology and tools for state encoding in asynchronous circuit synthesis , 1996, 33rd Design Automation Conference Proceedings, 1996.

[8]  Stephen B. Furber,et al.  Built-in self-testing of micropipelines , 1997, Proceedings Third International Symposium on Advanced Research in Asynchronous Circuits and Systems.

[9]  Steven M. Nowick,et al.  The Design of High-Performance Dynamic Asynchronous Pipelines: Lookahead Style , 2007, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[10]  Kwen-Siong Chong,et al.  Synchronous-Logic and Globally-Asynchronous-Locally-Synchronous (GALS) Acoustic Digital Signal Processors , 2012, IEEE Journal of Solid-State Circuits.

[11]  B. Chappell The fine art of IC design , 1999 .

[12]  Sachin S. Sapatnekar,et al.  Overcoming Variations in Nanometer-Scale Technologies , 2011, IEEE Journal on Emerging and Selected Topics in Circuits and Systems.

[13]  Hua Wang,et al.  Reliability Issues in Deep Deep Submicron Technologies: Time-Dependent Variability and its Impact on Embedded System Design , 2006, VLSI-SoC.

[14]  Viera Stopjakova,et al.  Current sensing methodology for completion detection in self-timed systems , 2011, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems.

[15]  C. L. Connell,et al.  A novel single-rail variable encoded completion detection scheme for self-timed circuit design using ternary multiple valued logic , 2001, Proceedings of the IEEE 2nd Dallas CAS Workshop on Low Power/Low Voltage Mixed-Signal Circuits & Systems (DCAS-01) (Cat. No.01EX454).

[16]  C. Sah,et al.  Theory of thermally stimulated charges in metal–oxide–semiconductor gate oxide , 1998 .

[17]  H. Lampinen,et al.  Circuit design for current-sensing completion detection , 1998, ISCAS '98. Proceedings of the 1998 IEEE International Symposium on Circuits and Systems (Cat. No.98CH36187).

[18]  Eby G. Friedman,et al.  Clock distribution networks in synchronous digital integrated circuits , 2001, Proc. IEEE.

[19]  Atsushi Kurokawa,et al.  Challenge: variability characterization and modeling for 65- to 90-nm processes , 2005, Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005..

[20]  Christoph Heer,et al.  Exploring pausible clocking based GALS design for 40-nm system integration , 2012, 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE).

[21]  Dominik Macko,et al.  VHDLVisualizer: HDL model visualization with simulation-based verification , 2012, 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).

[22]  C. Andre T. Salama,et al.  Low-power asynchronous Viterbi decoder for wireless applications , 2004, Proceedings of the 2004 International Symposium on Low Power Electronics and Design (IEEE Cat. No.04TH8758).

[23]  Kiyoshi Oguri,et al.  Asynchronous Circuit Design , 2001 .

[24]  Feng Shi,et al.  Test generation for ultra-high-speed asynchronous pipelines , 2005, IEEE International Conference on Test, 2005..

[25]  Elena Gramatová,et al.  Deductive Fault Simulation Technique for Asynchronous Circuits , 2010, Comput. Informatics.

[26]  Yousaf Zafar,et al.  Design of asynchronous MSP430 microprocessor using balsa back-end retargeting , 2009, 2009 5th Southern Conference on Programmable Logic (SPL).

[27]  Mark Horowitz,et al.  Self-timed logic using current-sensing completion detection (CSCD) , 1991, [1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors.

[28]  H. Lampinen,et al.  Implementation of a self-timed asynchronous parallel FIR filter using CSCD , 2004, Proceedings Norchip Conference, 2004..

[29]  R. Rajsuman,et al.  Iddq testing for CMOS VLSI , 1994, Proceedings of the IEEE.