Pencil beam coded aperture x-ray scatter imaging

We use coded aperture x-ray scatter imaging to interrogate scattering targets with a pencil beam. Observations from a single x-ray exposure of a flat-panel scintillation detector are used to simultaneously determine the along-beam positions and momentum transfer profiles of two crystalline powders (NaCl and Al). The system operates with a 3 cm range resolution and a momentum transfer resolution of 0.1 nm−1. These results demonstrate that a single snapshot can be used to estimate scattering properties along an x-ray beam, and serve as a foundation for volumetric imaging of scattering objects.

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