Advanced image processing in scanning probe microscopy
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[1] J. Bechhoefer,et al. Manipulation of van der Waals forces to improve image resolution in atomic‐force microscopy , 1993 .
[2] M. Goh,et al. An atomic force microscope (AFM) study of the calcite cleavage plane; image averaging in Fourier space , 1992 .
[3] E. Stoll,et al. Restoration of scanning-tunneling-microscope data blurred by limited resolution, and hampered by 1 /ƒ-like noise , 1987 .
[4] John C. Russ,et al. The Image Processing Handbook , 2016, Microscopy and Microanalysis.
[5] M. Porter,et al. Atomic scale imaging of alkanethiolate monolayers at gold surfaces with atomic force microscopy , 1992 .
[6] Boon Loo,et al. Microstructure analysis of thin films deposited by reactive evaporation and by reactive ion plating , 1989 .
[7] Erich Paul Stoll,et al. Picture processing and three-dimensional visualization of data from scanning tunneling and atomic force microscopy , 1991, IBM J. Res. Dev..