IPFA 2008 TABLE OF CONTENTS
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C. Boit | V. Pouget | D. Lewis | F. Essely | P. Fouillat | A. Firiti | G. Haller | V. Goubier | M. Sienkiewicz | R. Master | Localization Techniques | Cjr Sheppard | D. Zhu
[1] P. K. Tan,et al. Application of conductive atomic force microscopy to study the in-line electrical defects , 2008, 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
[2] K. Wu,et al. A new TDDB lifetime bi-model for eDRAM MIM capacitor with ZrO2 high-k dielectrics , 2008, 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
[3] Y. Li,et al. Study on SRAM soft failure using planar-view transmission electron microscopy techniques , 2008, 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
[4] S.P. Neo,et al. Application of FIB circuit edit combined with TIVA in advanced failure analysis , 2008, 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.