IPFA 2008 TABLE OF CONTENTS

[1]  P. K. Tan,et al.  Application of conductive atomic force microscopy to study the in-line electrical defects , 2008, 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

[2]  K. Wu,et al.  A new TDDB lifetime bi-model for eDRAM MIM capacitor with ZrO2 high-k dielectrics , 2008, 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

[3]  Y. Li,et al.  Study on SRAM soft failure using planar-view transmission electron microscopy techniques , 2008, 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

[4]  S.P. Neo,et al.  Application of FIB circuit edit combined with TIVA in advanced failure analysis , 2008, 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.