Investigation on Bonding Wire Short Caused by Vibration and Its Solution for High-Density Packaged ICs

A high-density packaged integrated circuit (IC) was found to be permanently abnormal due to its bonding wire short when the spacecraft equipment in which it was used was subjected to a mechanical shock. The IC is packaged in CPGA391 with an outline size of 47 $\text {mm} \times 47$ mm and has up to 492 internal bonding wires. Through the experiments, we found that the bonding wire short was caused by the collision between the two adjacent bonding wires when the IC was subjected to mechanical vibration. As the internal layout of the IC package cavity could not be further adjusted due to its functional requirements, a vacuum coating process was proposed for the bonding wire. The Parylene-N thin film was deposited on the surface of the bonding wire to form an insulating layer. It can improve the mechanical strength of the bonding wire and change the natural frequency of the bonding wire, which then makes the vibration amplitude of the bonding wire not too large and does not cause a collision of adjacent bonding wires. Some tests were carried out to verify the method, and the results show that it solves the problem of the bonding wire short under the condition of mechanical vibrations.

[1]  G. Mitic,et al.  IGBT module technology with high partial discharge resistance , 2001, Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248).

[2]  Brian J. Kim,et al.  Parylene MEMS patency sensor for assessment of hydrocephalus shunt obstruction , 2016, Biomedical microdevices.

[3]  Jeng-Nan Lee,et al.  A method to determine the sweep resistance of wire bonds for microelectronic packaging , 2008 .

[4]  R. C. Olberg The Effects of Epoxy Encapsulant Composition on Semiconductor Device Stability , 1971 .

[5]  C. E. Hoge Corrosion criteria for electronic packaging. III. Corrosion by package family , 1990 .

[6]  Huang-Kuang Kung,et al.  A theoretical study to improve wire sag of ultra-long wire bond loops for 3D/MCM packaging , 2017, Microelectron. Reliab..

[7]  Jeng-Nan Lee,et al.  Empirical Equation of Wire Sag Model for Semiconductor Packaging With Numerical and Experimental Verification , 2013, IEEE Transactions on Components, Packaging and Manufacturing Technology.

[8]  H. Chiu,et al.  A numerical prediction of wire crossover applying to microchip encapsulation , 2011, 2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).

[9]  B. Lian,et al.  Simulation of bonding wire deformation in random vibration , 2013, 2013 14th International Conference on Electronic Packaging Technology.

[11]  Lily D. Chambers,et al.  Parylene conformal coating encapsulation as a method for advanced tuning of mechanical properties of an artificial hair cell , 2013 .

[12]  Foong Chee Seng,et al.  Wire diameter and length effects on wire sweep performance of multi-tier copper and gold wire bonding in plastic ball grid array packages , 2011, 2011 IEEE 13th Electronics Packaging Technology Conference.

[13]  W. Nagy,et al.  A Comparison of AlGaN/GaN HFETs on Si Substrates in Ceramic Air Cavity and Plastic Overmold Packages , 2007, 2007 IEEE/MTT-S International Microwave Symposium.

[14]  J. L. Flood Reliability Aspects of Plastic Encapsulated Integrated Circuits , 1972 .

[15]  A. Hmiel,et al.  Wire bond short reduction by encapsulation , 2003, IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003..

[16]  Jeng-Nan Lee,et al.  The wire sweep analysis based on the evaluation of the bending and twisting moments for semiconductor packaging , 2006 .

[17]  Roger Olson Parylene conformal coatings for printed circuit board applications , 1985, 1985 EIC 17th Electrical/Electronics Insulation Conference.

[18]  Huang-Kuang Kung,et al.  The wire sag problem in wire bonding technology for semiconductor packaging , 2013, Microelectron. Reliab..

[19]  M. J. Fox A comparison of the performance of plastic and ceramic encapsulations based on evaluation of CMOS integrated circuits , 1977 .

[20]  R. E. Sundius A Recommendation for Ceramic Over Plastic IC Packages for 1972 Real-Time Commercial Computer Systems , 1972 .

[21]  Paul Conway,et al.  Combined Temperature and Vibration Testing for Wire Bond Interconnections in Harsh Environment Electronics , 2012 .

[22]  Huang-Kuang Kung Evaluation of sweep resistance of Q Auto-Loop and Square-Loop bonds for semiconductor packaging technology , 2007, Microelectron. Reliab..

[23]  Bo-Wun Huang,et al.  High-temperature wire sweep characteristics of semiconductor package for variable loop-height wirebonding technology , 2006 .

[24]  E. Meng,et al.  Parylene-Based Electrochemical-MEMS Transducers , 2010, Journal of Microelectromechanical Systems.

[25]  Ling Xu,et al.  Effect of Silicone Gel on the Reliability of Heavy Aluminum Wire Bond for Power Module During Thermal Cycling Test , 2016, 2016 IEEE 66th Electronic Components and Technology Conference (ECTC).