论文信息 - A novel methodology for the concurrent test of partial and dynamically reconfigurable SRAM-based FPGAs

A novel methodology for the concurrent test of partial and dynamically reconfigurable SRAM-based FPGAs

This paper presents the first truly non-intrusive structural concurrent test approach, aimed to test partial and dynamically reconfigurable SRAM-based FPGAs without disturbing their operation. This is accomplished by using a new methodology to carry out the replication of active configurable logic blocks (CLBs), i.e. CLBs that are part of an implemented function that is actually being used by the system, releasing it to be tested in a way that is completely transparent to the system.

Gustavo Ribeiro Alves | Manuel G. Gericota | José M. Ferreira | Miguel L. Silva

[1] Gustavo Ribeiro Alves,et al. DRAFT: an on-line fault detection method for dynamic and partially reconfigurable FPGAs , 2001, Proceedings Seventh International On-Line Testing Workshop.

[2] Carlos Delgado Kloos,et al. Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition , 2002, Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.