Electrical and Structural Properties of Mixed Chromium and Silicon Monoxide Films

Films containing a mixture of chromium and silicon monoxide were prepared on glass substrates by vacuum deposition. The significance of various deposition parameters was determined. The films were examined by x‐ray diffraction, electron microscopy, and ir reflectance and transmission. The electrical conductivity was measured as a function of temperature and applied electrical field. A relationship between film structure and electrical conductivity was found for film compositions which were almost metallic to almost insulating.