A study of base contact formation in epitaxial Si/Si 0.88 Ge 0.12 HBT structures
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C. Pickering | D. Robbins | F. Cristiano | J. Glasper | W. Y. Leong | P. Hemment | D. Hope | A. Nejim
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C. Pickering | D. Robbins | F. Cristiano | J. Glasper | W. Y. Leong | P. Hemment | D. Hope | A. Nejim