Dielectric loss of multilayer coupled microstrip line using SLR formulation

The single-layer reduction (SLR) formulation is presented to compute the dielectric loss of even–odd modes of a multilayer coupled microstrip line. Results are compared against the results of full-wave analysis with a maximum deviation of 2% for the wide range of parameters. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 31: 65–67, 2001.