Observation of single-defect memristor in an MoS2 atomic sheet
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D. Akinwande | L. Liang | Ruijing Ge | F. Huang | P. Chen | M. Chiang | An‐Ping Li | Wonhee Ko | S. Hus | Gavin E. Donnelly
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D. Akinwande | L. Liang | Ruijing Ge | F. Huang | P. Chen | M. Chiang | An‐Ping Li | Wonhee Ko | S. Hus | Gavin E. Donnelly