论文信息 - Characterization of threading dislocations in GaN (0001) substrates by photoluminescence imaging, cathodoluminescence mapping and etch pits - 字舞流文

Characterization of threading dislocations in GaN (0001) substrates by photoluminescence imaging, cathodoluminescence mapping and etch pits

Y. Sugawara | Y. Ishikawa | Yongzhao Yao | D. Yokoe | M. Sudo | Masaki Sudo | Daisaku Yokoe