Optical and structural characterization of copper indium disulfide thin films
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E. M. Gordon | Jerry D. Harris | L. Feldman | R. Mu | J. Hollingsworth | R. Raffaelle | A. Hepp | J. Keay | D. Henderson | A. Ueda | Y. Tung | W. E. Buhro | M. H. Wu | M. Huang
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