论文信息 - A New Parameter of Statistic Equality of Sampling Lengths in Surface Roughness Measurement

A New Parameter of Statistic Equality of Sampling Lengths in Surface Roughness Measurement

This paper presents the procedure for obtaining the primary profile, the waviness profile, and the roughness profile when measuring surface roughness, based on a set of recommendations from several ISO standards. An analysis was conducted and key insights into the procedure are given. In addition, a proposal to introduce a new parameter of statistical equality of sampling lengths when measuring surface roughness is included and the possible benefits from introducing the new parameter are stated.

Mikolaj Kuzinovski | Mite Tomov | Piotr Cichosz

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