Common-path configuration in total internal reflection digital holography microscopy

TIRDHM is a technique that allows to analyse the phase change of microscopical sections produced on the prism surface due to material attached on the top. Therefore, due to the evanescence waves properties we can analyse quantitatively the properties and specific morphology located to few nanometers on the top of surface contact. In this work, we study and present an alternative method to off-axis configuration to record and analyse the microscopical phase object information in Total Internal Reflection dispensing with the use of reference arm.