Tool Replacement for Photovoltaic Industry Processes With Multiple Characteristics Based on Capability Index

In the photovoltaic industry, measuring efficiency is an important process for manufacturing silicon wafers. The cutting tool gradually wears during the measuring efficiency process. Consequently, the fraction of defectives would gradually become significant. When the fraction defective reaches a certain level, the tool must be replaced. Therefore, it is essential to find out the optimal time to replace the cutting tool for minimizing the fraction defective and reducing the manufacturing cost. In this research, we consider the replacement problem in the photovoltaic industry to obtain the optimal replacement time for the measuring efficiency process. The measuring efficiency process involves multiple product quality characteristics, including the Isc, Voc, and Rsh. In order to maintain the high wafer process quality and to minimize the production cost, we first develop a method for measuring the manufacturing capability of measuring efficiency process. Then, a tool replacement policy is proposed to assess the true capability at each time period of measuring efficiency process and to find out the optimal time for tool replacement.

[1]  Kerstin Vännman,et al.  Process Capability Plots for One-Sided Specification Limits , 2007 .

[2]  B. Efron.  Bootstrap Methods: Another Look at the Jackknife , 1979 .

[3]  Yukihiko Nakata,et al.  Dynamics of innovation in solar cell industry: Divergence of solar cell technologies , 2011, First International Technology Management Conference.

[4]  Wen Lea Pearn,et al.  Precision Tool Condition Monitoring for Grinding Wheel in IC Manufacturing of Silicon Wafer , 2012 .

[5]  Charles P. Quesenberry,et al.  An SPC Approach to Compensating a Tool-Wear Process , 1988 .

[6]  Jyh-Jen Horng Shiau,et al.  Tool replacement policy for one-sided processes with low fraction defective , 2007, J. Oper. Res. Soc..

[7]  Filippo Spertino,et al.  Are Manufacturing $I$– $V$ Mismatch and Reverse Currents Key Factors in Large Photovoltaic Arrays? , 2009, IEEE Transactions on Industrial Electronics.

[8]  Fred A. Spiring,et al.  Assessing Process Capability: A Case Study , 2006 .

[9]  E. C. Kern,et al.  Early application of photovoltaics in the electric utility industry , 1990, IEEE Conference on Photovoltaic Specialists.

[11]  Kerstin Vännman.  Safety Regions in Process Capability Plots , 2006 .

[12]  B. Efron.  The jackknife, the bootstrap, and other resampling plans , 1987 .

[13]  R. Van Overstraeten,et al.  Low-cost industrial technologies of crystalline silicon solar cells , 1997, Proc. IEEE.

[14]  D. E. Hasti,et al.  Crystalline photovoltaic cell research status, and future direction , 1990, IEEE Conference on Photovoltaic Specialists.

[15]  Wen Lea Pearn,et al.  Measuring manufacturing capability for couplers and wavelength division multiplexers , 2005 .

[16]  Robert Tibshirani,et al.  Bootstrap Methods for Standard Errors, Confidence Intervals, and Other Measures of Statistical Accuracy , 1986 .

[17]  John J. Flaig.  Selecting Optimal Specification Limits , 2006 .