Lifetime of BASS devices on 50-ohm video pulser circuits

The reliability of the optically triggered Bulk Avalanche Semiconductor Switch (BASS) has been assessed in a variety of test conditions. For a nominal characterization diagnostic, we have adopted a 50-ohm video transmission line having a pulsewidth of 0.5 ns. At 11 kV input voltage we have found BASS lifetimes in excess of 1 Billion pulse. This level of device lifetime is a record achievement for optically triggered semiconductor switches. The reliability distribution is found to be of Weibull type. We discuss the implications of the reliability distribution and the performance of the device during lifetime evaluations.

[1]  Arye Rosen,et al.  Triggering GaAs lock-on switches with laser diode arrays , 1991, Other Conferences.

[2]  H. A. Sayadian,et al.  Generation of high-power broad-band microwave pulses by picosecond optoelectronic technique , 1989 .

[3]  B. James,et al.  Wideband Microwave Generation With GaAs Photoconductive Switches , 1991, Eighth IEEE International Conference on Pulsed Power.

[4]  T. Burke,et al.  Physics and Applications of the Lock-on Effect , 1991, Eighth IEEE International Conference on Pulsed Power.