Low-temperature ALD process development of 200 mm wafer-scale MoS2 for gas sensing application
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A. Ostendorf | A. Devi | M. Becher | A. Grabmaier | C. Bock | R. Neubieser | Jan‐Lucas Wree | J. Jagosz | M. Michel | J.-L. Wree
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A. Ostendorf | A. Devi | M. Becher | A. Grabmaier | C. Bock | R. Neubieser | Jan‐Lucas Wree | J. Jagosz | M. Michel | J.-L. Wree