Investigation of the p-GaN Gate Breakdown in Forward-Biased GaN-Based Power HEMTs
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Enrico Sangiorgi | Paolo Magnone | Niels Posthuma | Claudio Fiegna | Stefaan Decoutere | Steve Stoffels | Andrea Natale Tallarico | S. Decoutere | A. Tallarico | C. Fiegna | E. Sangiorgi | P. Magnone | N. Posthuma | S. Stoffels
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