An EELS signal-from-background separation algorithm for spectral line-scan/image quantification.

Background removal is an important step in the quantitative analysis of electron energy-loss structure. Existing methods usually require an energy-loss region outside the fine structure in order to estimate the background. This paper describes a method for signal-from-background separation that is based on subspace division. The linear space is divided into two subspaces. The signal is recovered from a linear subspace containing no background information, and the other subspace containing the background is discarded. This method does not rely on any signal outside the energy-loss range of interest and should be very helpful for multiple linear least-squares (MLLS) regression analysis on experimental signals with little or no available smooth pre-edge region or with overlapping pre-edge features. Use of the algorithm is demonstrated with several practical applications, including closely overlapping core-loss spectra and zero-loss peak removal. Tests based on experimental data indicate that the algorithm has similar or better performance relative to conventional pre-edge power-law fitting methods in applications such as MLLS regression for electron energy-loss near-edge structure.

[1]  R. Egerton A revised expression for signal/noise ratio in EELS , 1982 .

[2]  D R G Mitchell,et al.  Scripting-customized microscopy tools for Digital Micrograph. , 2005, Ultramicroscopy.

[3]  K. Leifer,et al.  The usage of data compression for the background estimation of electron energy loss spectra. , 2017, Ultramicroscopy.

[4]  R. Egerton Electron Energy-Loss Spectroscopy in the Electron Microscope , 1995, Springer US.

[5]  K. Kimoto,et al.  Advantages of a monochromator for bandgap measurements using electron energy-loss spectroscopy. , 2005, Micron.

[6]  R. Egerton Inelastic scattering of 80 keV electrons in amorphous carbon , 1975 .

[7]  Akira Ohtomo,et al.  Atomic-scale imaging of nanoengineered oxygen vacancy profiles in SrTiO3 , 2004, Nature.

[8]  José M. Bioucas-Dias,et al.  Vertex component analysis: a fast algorithm to unmix hyperspectral data , 2005, IEEE Transactions on Geoscience and Remote Sensing.

[9]  Large positive linear magnetoresistance in the two-dimensional t2g electron gas at the EuO/SrTiO3 interface , 2018, Scientific reports.

[10]  M. Malac,et al.  Improved background-fitting algorithms for ionization edges in electron energy-loss spectra. , 2002, Ultramicroscopy.

[11]  David B. Williams,et al.  Transmission Electron Microscopy: A Textbook for Materials Science , 1996 .

[12]  J Verbeeck,et al.  Model based quantification of EELS spectra. , 2004, Ultramicroscopy.

[13]  R. E. Kalman,et al.  A New Approach to Linear Filtering and Prediction Problems , 2002 .

[14]  R. Egerton K-shell ionization cross-sections for use in microanalysis , 1979 .

[15]  P. Batson,et al.  Vibrational spectroscopy in the electron microscope , 2014, Nature.

[16]  Pierre Comon,et al.  Handbook of Blind Source Separation: Independent Component Analysis and Applications , 2010 .