Mechanical, Electrical, and Crystallographic Property Dynamics of Bent and Strained Ge/Si Core-Shell Nanowires As Revealed by in situ Transmission Electron Microscopy.
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L. Bourgeois | N. Fukata | Chao Zhang | D. Golberg | P. Sorokin | D. Kvashnin | Joseph F. S. Fernando | K. Firestein