Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process
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N. Balakrishnan | M. Pecht | W. Meeker | F. Cadini | B. Thuraisingham | E. Zio | Wenbin Wang | Changhua Hu | G. Peloni | S. Sun | S. Eryilmaz | H. Liao | W. Kuo | Dong Zhou | Hong Kong | X. Xu | X. Huang | W. Wang | J. Shi | Zhang | Q. Yang | Y. Hong | S. Sun | V. Debroy | Xiaosheng Si | H.-Z Liu | W. E. Wong | R. Golden | Y. Chen | D. Zhou
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