Fault simulation under the multiple observation time approach using backward implications
暂无分享,去创建一个
[1] Melvin A. Breuer,et al. Digital systems testing and testable design , 1990 .
[2] Irith Pomeranz,et al. The Multiple Observation Time Test Strategy , 1992, IEEE Trans. Computers.
[3] Bernd Becker,et al. A hybrid fault simulator for synchronous sequential circuits , 1994, Proceedings., International Test Conference.
[4] Elizabeth M. Rudnick,et al. On potential fault detection in sequential circuits , 1996, Proceedings International Test Conference 1996. Test and Design Validity.
[5] Seh-Woong Jeong,et al. Synchronizing sequences and symbolic traversal techniques in test generation , 1993, J. Electron. Test..
[6] Janak H. Patel,et al. HITEC: a test generation package for sequential circuits , 1991, Proceedings of the European Conference on Design Automation..
[7] Irith Pomeranz,et al. On Fault Simulation for Synchronous Sequential Circuits , 1995, IEEE Trans. Computers.
[8] Irith Pomeranz,et al. Low-complexity fault simulation under the multiple observation time testing approach , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).