Fault simulation under the multiple observation time approach using backward implications

We present an improved procedure for fault simulation under themultiple observation time approach based on state expansion.Under state expansion, an incompletely specified state reachedduring fault simulation is replaced by 2{k} states, each one assigninga different combination to k unspecified present state variables.For each expanded state, additional output values are thenimplied. As a result, a fault that cannot be identified as detectedusing conventional simulation may now be identified as detected.The procedure proposed here enhances state expansion by backwardimplications to take advantage of every present state variablevalue specified under state expansion. As a result of usingbackward implications, fewer states need to be considered afterstate expansion, fewer state expansions are potentially neededfor every fault, and the number of faults that can be efficientlyconsidered is increased. Experimental results are presented tosupport these claims.

[1]  Melvin A. Breuer,et al.  Digital systems testing and testable design , 1990 .

[2]  Irith Pomeranz,et al.  The Multiple Observation Time Test Strategy , 1992, IEEE Trans. Computers.

[3]  Bernd Becker,et al.  A hybrid fault simulator for synchronous sequential circuits , 1994, Proceedings., International Test Conference.

[4]  Elizabeth M. Rudnick,et al.  On potential fault detection in sequential circuits , 1996, Proceedings International Test Conference 1996. Test and Design Validity.

[5]  Seh-Woong Jeong,et al.  Synchronizing sequences and symbolic traversal techniques in test generation , 1993, J. Electron. Test..

[6]  Janak H. Patel,et al.  HITEC: a test generation package for sequential circuits , 1991, Proceedings of the European Conference on Design Automation..

[7]  Irith Pomeranz,et al.  On Fault Simulation for Synchronous Sequential Circuits , 1995, IEEE Trans. Computers.

[8]  Irith Pomeranz,et al.  Low-complexity fault simulation under the multiple observation time testing approach , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).