论文信息 - Determination of Surface Structures using LEED and Energy Analysis of Scattered Electrons

Determination of Surface Structures using LEED and Energy Analysis of Scattered Electrons

It is shown that the energy analysis of scattered electrons (EASE) is a useful tool when used in conjunction with the conventional LEED surface studies. It is demonstrated that the sensitivity is such that 0.02 monolayers of Cs can be detected on a Si surface. The Auger peak for K on a Ge(111) surface has been calibrated quantitatively and this calibration has been used to determine the K coverage after the overlayer was partially desorbed by heat treatments. The coverage measurements were used along with the LEED patterns to determine the surface structure.

R. E. Weber | A. Johnson

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