Decoding test method and decoding test control device using its method at the source driver of liquid crystal display device for thin flim transistor

The present invention relates to a method of testing a decoder in TFT LCD source driver and a decoder for controlling the test apparatus using the same. Each LCD source driver for TFT are N M for selecting one of the 2 In normal mode, each of the N-bit data which is input sequentially is a memory after being sequentially latched in place, since the date and time outputted to the decoder, the output of the decoder, each panel display voltage corresponding to each of the decoder at the same time It is obtained. To test these decoder, the first latch as a data, that is data for testing one of the 2 Thereafter, by outputting the data for testing in both the decoder gets the data corresponding to the data for the test from the decoder, respectively. After that, it performs a predetermined test in each of the data obtained from the decoder via this process.