论文信息 - A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps - 字舞流文

A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps

M. Vanzi | M. Meneghini | G. Meneghesso | A. Chini | E. Zanoni | A. Stocco | G. Mura | D. Marcon | M. Bertin | P. Malinowski | E. Musu | G. Dal Santo