论文信息 - Burn-in effects on total dose radiation sensitivity

Burn-in effects on total dose radiation sensitivity

The effects of burn-in on the sensitivity to total dose radiation of discrete transistors and linear integrated circuits (ICs) of several types from different manufacturers are examined. Significant differences in the behavior of different devices are noted. The impact of burn-in on radiation hardness assurance is assessed.

R. L. Pease | J. Gorelick | S. S. McClure

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