Nuclear monochromator by grazing incidence antireflection films of 119SnO2

A nuclear monochromator using grazing incidence anti-reflection (GIAR) films of 119SnO2 coated on a Pd backing mirror was designed, fabricated and characterized. 119SnO2/Pd/quartz GIAR films were synthesized by a magnetron reactive sputtering technique. The films were characterized by x-ray scattering of 23.87 keV synchrotron radiation source. From the measurement of off-resonance reflectivity and the simulation of the resonant nuclear reflectivity, approximately 0.8 reflectivity with 10-2 electronic reflectivity and an energy band width approximately 100 (Gamma) where (Gamma) is a natural line width, at a 2 mrad incident beam angle would be expected. The requirements and alternative methods to improve performance of a GIAR film nuclear monochromator were discussed.