论文信息 - New results in sublimation growth of the SiC epilayers - 字舞流文

New results in sublimation growth of the SiC epilayers

A. Lebedev | A. Strel'chuk | N. Savkina | A. Tregubova | M. A. Yagovkina | D. Davydov

[1] Tsunenobu Kimoto,et al. Deep Defect Centers in Silicon Carbide Monitored with Deep Level Transient Spectroscopy , 1997 .