Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement
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Hiroshi Iwai | Nobuyuki Sugii | Chunmeng Dou | Kuniyuki Kakushima | Tomoya Shoji | Kazuhiro Nakajima | Parhat Ahmet | Yoshinori Kataoka | Akira Nishiyama | Hitoshi Wakabayashi | Kazuo Tsutsui | Kenji Natori
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