Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies
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Sa. K. Narayandass | G. M. Rao | V. S. Kumar | D. Mangalaraj | B. Karunagaran | R. Kumar | S. K. Narayandass | R. Kumar | V. S. Kumar | S. Narayandass