论文信息 - Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy - 字舞流文

Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Shulong Lu | P. Dai | S. Uchida | L. Bian | Junhua Long | Wenxian Yang | Xuefei Li | Z. Xing | Yukun Zhao | Junqi Lai | Qi Chen