Evaluating different implementations of online junction temperature sensing for switching power semiconductors
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[1] E. Bianda,et al. Online estimation of IGBT junction temperature (Tj) using gate-emitter voltage (Vge) at turn-off , 2013, 2013 15th European Conference on Power Electronics and Applications (EPE).
[2] Robert D. Lorenz,et al. Sensing Gallium Nitride HEMT junction temperature using gate drive output transient properties , 2016, 2016 IEEE Applied Power Electronics Conference and Exposition (APEC).
[3] Philippe Godignon,et al. Monolithically Integrated Temperature Sensor in Silicon Carbide Power MOSFETs , 2014, IEEE Transactions on Power Electronics.
[4] Zheng Xu,et al. Power losses evaluation for modular multilevel converter with junction temperature feedback , 2011, 2011 IEEE Power and Energy Society General Meeting.
[5] T. Plum,et al. On-line Junction Temperature Measurement of CoolMOS Devices , 2007, 2007 7th International Conference on Power Electronics and Drive Systems.
[6] C.C.-H. Hsu,et al. A numerical model for simulating MOSFET gate current degradation by considering the interface state generation , 1996, 1996 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD '96 (IEEE Cat. No.96TH8095).
[7] F. Pfirsch,et al. Influence of dynamic switching on the robustness of power devices against cosmic radiation , 2012, 2012 24th International Symposium on Power Semiconductor Devices and ICs.
[8] F. Hsu,et al. Structure-enhanced MOSFET degradation due to hot-electron injection , 1984, IEEE Electron Device Letters.
[9] A. Agarwal,et al. Comparisons of SiC MOSFET and Si IGBT Based Motor Drive Systems , 2007, 2007 IEEE Industry Applications Annual Meeting.
[10] U. Feldmann,et al. Temperature dependence of switching performance in IGBT circuits and its compact modeling , 2011, 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs.
[11] Robert D. Lorenz,et al. Evaluating Different Implementations of Online Junction Temperature Sensing for Switching Power Semiconductors , 2015, IEEE Transactions on Industry Applications.
[12] Lipei Huang,et al. Power loss and junction temperature analysis of power semiconductor devices , 1999, Conference Record of the 1999 IEEE Industry Applications Conference. Thirty-Forth IAS Annual Meeting (Cat. No.99CH36370).
[13] Stig Munk-Nielsen,et al. An online Vce measurement and temperature estimation method for high power IGBT module in normal PWM operation , 2014, 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE ASIA).
[14] G. S. Deep,et al. A highly linear single p-n junction temperature sensor , 1994 .
[15] L. Dupont,et al. Temperature Measurement of Power Semiconductor Devices by Thermo-Sensitive Electrical Parameters—A Review , 2012, IEEE Transactions on Power Electronics.
[16] D.A. Murdock,et al. Active thermal control of power electronic modules , 2003, IEEE Transactions on Industry Applications.
[17] Y. Seki,et al. A new vertical IGBT structure with a monolithic over-current, over-voltage, and over-temperature sensing and protecting circuit , 1995, IEEE Electron Device Letters.
[18] Robert D. Lorenz,et al. Sensing Power MOSFET Junction Temperature Using Circuit Output Current Ringing Decay , 2013, IEEE Transactions on Industry Applications.
[19] Paul Louis Garbarino,et al. New Method of Monitoring Junction Temperature , 1971 .
[20] Steffen Bernet,et al. New junction temperature balancing method for a three level active NPC converter , 2011, Proceedings of the 2011 14th European Conference on Power Electronics and Applications.
[21] Allen R. Hefner,et al. A dynamic electro-thermal model for the IGBT , 1992, Conference Record of the 1992 IEEE Industry Applications Society Annual Meeting.
[22] D. Blackburn. Temperature measurements of semiconductor devices - a review , 2004, Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545).
[23] Laurent Dupont,et al. Preliminary Evaluation of Thermo-Sensitive Electrical Parameters Based on the Forward Voltage for Online Chip Temperature Measurements of IGBT Devices , 2015, IEEE Transactions on Industry Applications.
[24] F.C. Lee,et al. Analytical loss model of power MOSFET , 2006, IEEE Transactions on Power Electronics.
[25] E. R. Motto,et al. IGBT module with user accessible on-chip current and temperature sensors , 2012, 2012 Twenty-Seventh Annual IEEE Applied Power Electronics Conference and Exposition (APEC).
[26] Seung-Ki Sul,et al. On-line estimation of IGBT junction temperature using on-state voltage drop , 1998, Conference Record of 1998 IEEE Industry Applications Conference. Thirty-Third IAS Annual Meeting (Cat. No.98CH36242).
[27] G. S. Deep,et al. A p-n junction temperature sensor with switched current excitation , 1993, 1993 IEEE Instrumentation and Measurement Technology Conference.
[28] Robert D. Lorenz,et al. Sensing power MOSFET junction temperature using gate drive turn-on current transient properties , 2014 .
[29] L. Dupont,et al. Comparison of Junction Temperature Evaluations in a Power IGBT Module Using an IR Camera and Three Thermosensitive Electrical Parameters , 2013, IEEE Transactions on Industry Applications.
[30] Pengfei Sun,et al. Online junction temperature extraction with turn-off delay time for high power IGBTs , 2014, 2014 IEEE Energy Conversion Congress and Exposition (ECCE).
[31] Marco Liserre,et al. Online junction temperature measurement via internal gate resistance during turn-on , 2014, 2014 16th European Conference on Power Electronics and Applications.
[32] P. P. Acarnley,et al. Real-time power electronic device junction temperature estimation , 2004 .
[33] Ivan Bahun,et al. Real-Time Measurement of IGBT's Operating Temperature , 2011 .
[34] Wei Qiao,et al. Frequency-domain transient temperature estimation and aging analysis for weak points of IGBT modules , 2014, 2014 IEEE Energy Conversion Congress and Exposition (ECCE).
[35] X. Perpina,et al. Power-Substrate Static Thermal Characterization Based on a Test Chip , 2008, IEEE Transactions on Device and Materials Reliability.
[36] T. Kajiwara,et al. New intelligent power multi-chips modules with junction temperature detecting function , 1998, Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs. ISPSD'98 (IEEE Cat. No.98CH36212).
[37] A. A. Osman,et al. Investigation of high temperature effects on MOSFET transconductance (g/sub m/) , 1998, 1998 Fourth International High Temperature Electronics Conference. HITEC (Cat. No.98EX145).
[38] C. Z. Lu,et al. Fast measurement of the peak junction temperature of power transistors using electrical method , 1991, 1991 Proceedings, Seventh IEEE Semiconductor Thermal Measurement and Management Symposium.
[39] Zhongwei Qi,et al. Thermal management of MOSFET junction temperature in RF amplifier , 2011, 2011 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium.
[40] Pengfei Sun,et al. Junction Temperature Extraction Approach With Turn-Off Delay Time for High-Voltage High-Power IGBT Modules , 2016, IEEE Transactions on Power Electronics.
[41] Fred Wang,et al. Junction temperature measurement of IGBTs using short circuit current , 2012, 2012 IEEE Energy Conversion Congress and Exposition (ECCE).
[42] Mounira Berkani,et al. Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling , 2011, IEEE Transactions on Industrial Electronics.
[43] Uwe Scheuermann,et al. Using the chip as a temperature sensor — The influence of steep lateral temperature gradients on the Vce(T)-measurement , 2009, 2009 13th European Conference on Power Electronics and Applications.
[44] L. Ran,et al. Investigation Into IGBT dV/dt During Turn-Off and Its Temperature Dependence , 2011, IEEE Transactions on Power Electronics.
[45] Robert D. Lorenz,et al. Active thermal control of power electronics modules , 2003 .
[46] Marco Liserre,et al. Improved Reliability of Power Modules: A Review of Online Junction Temperature Measurement Methods , 2014, IEEE Industrial Electronics Magazine.
[47] Valerie Eveloy,et al. Validation and application of different experimental techniques to measure electronic component operating junction temperature , 1999 .
[48] Robert D. Lorenz,et al. The effect of gate drive topology on online silicon carbide MOSFET junction temperature sensing , 2015, 2015 IEEE Energy Conversion Congress and Exposition (ECCE).
[49] Weifeng Sun,et al. Model of hot-carrier degradation for lateral IGBT device on SOI substrate , 2013 .
[50] D. Schmitt-Landsiedel,et al. Dynamic degradation in MOSFET's. II. Application in the circuit environment , 1991 .
[51] Enea Bianda,et al. Simultaneous online estimation of junction temperature and current of IGBTs using emitter-auxiliary emitter parasitic inductance , 2014 .
[52] M.H. Bierhoff,et al. Semiconductor losses in voltage source and current source IGBT converters based on analytical derivation , 2004, 2004 IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551).
[53] Stig Munk-Nielsen,et al. Online chip temperature monitoring using υce-load current and IR thermography , 2015, 2015 IEEE Energy Conversion Congress and Exposition (ECCE).
[54] Volker Pickert,et al. On-line Monitoring of the MOSFET Device Junction Temperature by Computation of the Threshold Voltage , 2006 .
[55] F. Blaabjerg,et al. An extended model of power losses in hard-switched IGBT-inverters , 1996, IAS '96. Conference Record of the 1996 IEEE Industry Applications Conference Thirty-First IAS Annual Meeting.
[56] Kristian Bonderup Pedersen,et al. Dynamic Modeling Method of Electro-Thermo-Mechanical Degradation in IGBT Modules , 2016, IEEE Transactions on Power Electronics.
[57] Dushan Boroyevich,et al. Extraction of parasitics within wire-bond IGBT modules , 1998, APEC '98 Thirteenth Annual Applied Power Electronics Conference and Exposition.
[58] Robert D. Lorenz,et al. Sensing IGBT junction temperature using gate drive output transient properties , 2015, 2015 IEEE Applied Power Electronics Conference and Exposition (APEC).
[59] G. Gildenblat,et al. Measurements and modeling of the n-channel MOSFET inversion layer mobility and device characteristics in the temperature range 60-300 K , 1990 .
[60] T. Zhou,et al. A quick method for estimating junction temperature profiles in transient applications , 1996, InterSociety Conference on Thermal Phenomena in Electronic Systems, I-THERM V.