Two-Phase Degradation Process Model With Abrupt Jump at Change Point Governed by Wiener Process
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[1] David W. Coit,et al. n Subpopulations experiencing stochastic degradation: reliability modeling, burn-in, and preventive replacement optimization , 2013 .
[2] David V. Hinkley,et al. Inference about the change-point in a sequence of binomial variables , 1970 .
[3] Narayanaswamy Balakrishnan,et al. EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution , 2016, IEEE Transactions on Reliability.
[4] Tao Yuan,et al. A Bayesian approach to modeling two-phase degradation using change-point regression , 2015, Reliab. Eng. Syst. Saf..
[5] P. Fearnhead,et al. Optimal detection of changepoints with a linear computational cost , 2011, 1101.1438.
[6] Suk Joo Bae,et al. A change-point analysis for modeling incomplete burn-in for light displays , 2006 .
[7] Zhengqiang Pan,et al. Reliability modeling of degradation of products with multiple performance characteristics based on gamma processes , 2011, Reliab. Eng. Syst. Saf..
[8] Alaa Elwany,et al. Sensor-driven prognostic models for equipment replacement and spare parts inventory , 2008 .
[9] Nagi Gebraeel,et al. Computing and updating the first-passage time distribution for randomly evolving degradation signals , 2012 .
[10] Jen Tang,et al. A MODIFIED EM-ALGORITHM FOR ESTIMATING THE PARAMETERS OF INVERSE GAUSSIAN DISTRIBUTION BASED ON TIME-CENSORED WIENER DEGRADATION DATA , 2007 .
[11] Edward P. C. Kao,et al. Lévy-driven non-Gaussian Ornstein–Uhlenbeck processes for degradation-based reliability analysis , 2016 .
[12] Donghua Zhou,et al. Remaining useful life estimation - A review on the statistical data driven approaches , 2011, Eur. J. Oper. Res..
[13] Bo Guo,et al. Residual life estimation based on a generalized Wiener degradation process , 2014, Reliab. Eng. Syst. Saf..
[14] Narayanaswamy Balakrishnan,et al. Mis-specification analyses of gamma and Wiener degradation processes , 2011 .
[15] S. Panchapakesan,et al. Inference about the Change-Point in a Sequence of Random Variables: A Selection Approach , 1988 .
[16] T. A. Harris,et al. Rolling Bearing Analysis , 1967 .
[17] Jen Tang,et al. Optimum step-stress accelerated degradation test for Wiener degradation process under constraints , 2015, Eur. J. Oper. Res..
[18] Tsan Sheng Ng,et al. An Application of the EM Algorithm to Degradation Modeling , 2008, IEEE Transactions on Reliability.
[19] Nagi Gebraeel,et al. Residual life predictions from vibration-based degradation signals: a neural network approach , 2004, IEEE Transactions on Industrial Electronics.
[20] Rong Li,et al. Residual-life distributions from component degradation signals: A Bayesian approach , 2005 .
[21] Min Xie,et al. Stochastic modelling and analysis of degradation for highly reliable products , 2015 .
[22] Bo Henry Lindqvist,et al. Modeling of dependent competing risks by first passage times of Wiener processes , 2008 .
[23] Steven Kou,et al. Option Pricing Under a Double Exponential Jump Diffusion Model , 2001, Manag. Sci..
[24] Lu Min. THE DISTRIBUTIONS OF EXTREME VALUE FOR BROWNIAN MOTION WITH NONLINEAR DRIFT , 2010 .
[25] Steven M. Cox,et al. Stochastic models for degradation-based reliability , 2005 .
[26] David W. Coit,et al. Life distribution analysis based on Lévy subordinators for degradation with random jumps , 2015 .
[27] Sheng-Tsaing Tseng,et al. Optimal burn-in policy by using an integrated Wiener process , 2004 .
[28] Xiao Liu,et al. Condition-based maintenance for continuously monitored degrading systems with multiple failure modes , 2013 .
[29] Bo Guo,et al. Real-time Reliability Evaluation with a General Wiener Process-based Degradation Model , 2014, Qual. Reliab. Eng. Int..
[30] Jen Tang,et al. Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model , 2008 .
[31] Lirong Cui,et al. Sensor-based calibrations to improve reliability of systems subject to multiple dependent competing failure processes , 2017, Reliab. Eng. Syst. Saf..
[32] Lirong Cui,et al. Degradation Models With Wiener Diffusion Processes Under Calibrations , 2016, IEEE Transactions on Reliability.
[33] Zhihua Wang,et al. A Wiener process model for accelerated degradation analysis considering measurement errors , 2016, Microelectron. Reliab..
[34] Ming J. Zuo,et al. Multistate degradation and supervised estimation methods for a condition-monitored device , 2014 .
[35] Nagi Gebraeel,et al. Stochastic modeling and real-time prognostics for multi-component systems with degradation rate interactions , 2014 .
[36] J. Ibrahim,et al. Model Selection Criteria for Missing-Data Problems Using the EM Algorithm , 2008, Journal of the American Statistical Association.
[37] Chanseok Park. Parameter estimation from load-sharing system data using the expectation–maximization algorithm , 2013 .
[38] David W. Coit,et al. Condition-Based Maintenance for Repairable Deteriorating Systems Subject to a Generalized Mixed Shock Model , 2015, IEEE Transactions on Reliability.
[39] Kwok-Leung Tsui,et al. Degradation Data Analysis Using Wiener Processes With Measurement Errors , 2013, IEEE Transactions on Reliability.
[40] Loon Ching Tang,et al. Degradation-Based Burn-In Planning Under Competing Risks , 2012, Technometrics.
[41] Hui Wang,et al. First passage times of a jump diffusion process , 2003, Advances in Applied Probability.
[42] Sheng-Tsaing Tseng,et al. Mis-Specification Analysis of Linear Degradation Models , 2009, IEEE Transactions on Reliability.
[43] Kwok-Leung Tsui,et al. Condition monitoring and remaining useful life prediction using degradation signals: revisited , 2013 .
[44] Qianmei Feng,et al. Reliability modeling for dependent competing failure processes with changing degradation rate , 2014 .
[45] A. Scott,et al. A Cluster Analysis Method for Grouping Means in the Analysis of Variance , 1974 .
[46] Lirong Cui,et al. Bayesian inference of multi-stage reliability for degradation systems with calibrations , 2016 .
[47] B. Yum,et al. Optimal design of accelerated degradation tests based on Wiener process models , 2011 .
[48] Tzong-Ru Tsai,et al. Inference From Lumen Degradation Data Under Wiener Diffusion Process , 2012, IEEE Transactions on Reliability.
[49] Narayanaswamy Balakrishnan,et al. EM algorithm for one-shot device testing with competing risks under exponential distribution , 2015, Reliab. Eng. Syst. Saf..
[50] Arjun K. Gupta,et al. Parametric Statistical Change Point Analysis , 2000 .