A distributed BIST technique for diagnosis of MCM interconnections

A general description of an enhanced scheme for designing completely self-testable MCMs is given. It allows performance testing and diagnosis of MCM interconnections for dynamic effects. This scheme is based on embedding of cascadable test pattern generators and reconfigurable signature analyzers into the design of MCM dies. A theory of partitioning of linear registers is applied to devise a two phase distributed diagnosis strategy The design of a novel MISR reconfiguration scheme that enables high diagnosis resolution, is presented. Simulation results obtained confirm the effectiveness of our BIST technique.

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