Strains and Relaxations Near metal Alumlnide/Semiconductor Interfaces
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[1] P. Cohen,et al. Growth and characterization of iron aluminide films on compound semiconductors , 1991 .
[2] Jeffrey Y. Tsao,et al. Relaxation of strained-layer semiconductor structures via plastic flow , 1987 .
[3] W. Jesser,et al. Low energy dislocation structures in epitaxy , 1986 .
[4] G. Sauthoff,et al. Dislocation creep in the ordered intermetallic (Fe, Ni)Al phase , 1986 .
[5] E. Pippel,et al. Influence of Substrate Deformations on Interface Structures. II. Experimental Investigations for Epitaxial Ag/Pd and Au/Pd Bicrystals , 1983 .
[6] E. Pippel,et al. Influence of substrate deformations on interface structures. I. Theory , 1983 .
[7] David C. Joy,et al. Electron channeling patterns in the scanning electron microscope , 1982 .
[8] J. W. Matthews. CHAPTER 8 – COHERENT INTERFACES AND MISFIT DISLOCATIONS , 1975 .
[9] D. L. Allinson. 3.6 – Measurement of Microstrains in Thin Epitaxial Films , 1975 .
[10] C. Humphreys,et al. A dynamical theory for the contrast of perfect and imperfect crystals in the scanning electron microscope using backscattered electrons , 1972 .