Modelling of electron and hole trapping in oxides
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P. Sushko | K. McKenna | D. M. Ramo | A. Kimmel | A. Shluger | A. L. Shluger | K P McKenna | P V Sushko | A V Kimmel
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P. Sushko | K. McKenna | D. M. Ramo | A. Kimmel | A. Shluger | A. L. Shluger | K P McKenna | P V Sushko | A V Kimmel