Extracting interaction forces and complementary observables in dynamic probe microscopy
暂无分享,去创建一个
[1] F. Giessibl,et al. Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy , 1995, Science.
[2] C. Gerber,et al. Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7 , 1996 .
[3] M. Ohta,et al. Atomic resolution imaging of InP(110) surface observed with ultrahigh vacuum atomic force microscope in noncontact mode , 1996 .
[4] C. Gerber,et al. Ultrahigh vacuum atomic force microscopy : true atomic resolution , 1997 .
[5] J. Mannhart,et al. Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy , 1999 .
[6] U. Dürig,et al. Interaction force detection in scanning probe microscopy: Methods and applications , 1992 .
[7] P. Guethner. Simultaneous imaging of Si(111) 7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode , 1996 .
[8] U. Dürig,et al. Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy , 1999 .
[9] Krueger,et al. Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects. , 1996, Physical review. B, Condensed matter.