Theoretical study of method based on ellipsometry for measurement of complex permittivity of materials
暂无分享,去创建一个
A new approach, based on ellipsometry and adapted to microwave frequencies, is presented for the in situ measurement of the complex permittivity of materials. The work serves to characterise the accuracy and the sensitivity of the method.
[1] E. Wolf,et al. Principles of Optics , 2019 .
[2] Theodore S. Rappaport,et al. In situ microwave reflection coefficient measurements for smooth and rough exterior wall surfaces , 1993, IEEE 43rd Vehicular Technology Conference.
[3] Vijay K. Varadan,et al. A free-space bistatic calibration technique for the measurement of parallel and perpendicular reflection coefficients of planar samples , 1991 .