Correlation of plasma process induced charging with Fowler-Nordheim stress in p- and n-channel transistors
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R. Chau | P. Moon | R. Chau | P. Moon | L. Yau | G. Vandentop | B. Sabi | G. Vandentop | S. Hui | Y.-H. Lee | L. Yau | E. Hansen | B. Sabi | E. Hansen | Y. Lee | S. Hui
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