Quantifying Geometry Parameters of Defect in Multi-layered Structures from Eddy Current Nondestructive Evaluation Signals by Using Genetic Algorithm

In order to detect defects in multilayered conductive structures, a novel approach to accurately quantify the two-dimensional axial symmetry defect geometry parameters from eddy current nondestructive evaluation (ECNDE) signals is presented. The method uses a finite element forward model to simulate the underlying physical process and the genetic algorithm (GA) to solve the inverse problem. Experimental results confirm the validity of the approach