Noise spikes in digital VLSI circuits

An analysis is presented of the appearance of occasional noise spikes in very complex VLSI circuits. The noise spikes may cause so-called soft errors if the operating frequency is high and the variations in channel resistance large. The main contributing noise source is capacitive and inductive crosstalk. Noise spikes in present-day circuits are about an order of magnitude smaller than spikes caused by radioactive decay of trace elements in the encapsulation, and by cosmic rays. Fault-tolerant circuit design reducing the influence of radioactive and cosmic ray bombardment will help against noise spikes as well. A comparison is made with noise spikes in neurons.

[1]  Derksen He,et al.  Axon membrane voltage fluctuations. , 1965 .

[2]  H. Derksen.  Axon membrane voltage fluctuations. , 1965, Acta physiologica et pharmacologica Neerlandica.

[3]  S. K. Mullick,et al.  Analysis of Transmission Lines on Integrated-Circuit Chips , 1967 .

[4]  D. K. Lynn,et al.  Complex Monolithic Arrays: Some Aspects of Design and Fabrication , 1967 .

[5]  I. Krishnan,et al.  G-R noise and microscopic defects in irradiated junction field effect transistors , 1977 .

[6]  I. Bahl,et al.  Characteristics of Coupled Microstriplines , 1979 .

[7]  P. J. McNulty,et al.  Soft Errors Induced by Energetic Protons , 1979, IEEE Transactions on Nuclear Science.

[8]  J. Ziegler,et al.  Effect of Cosmic Rays on Computer Memories , 1979, Science.

[9]  T. May,et al.  Alpha-particle-induced soft errors in dynamic memories , 1979, IEEE Transactions on Electron Devices.

[10]  D.S. Yaney,et al.  Alpha-particle tracks in silicon and their effect on dynamic MOS RAM reliability , 1979, IEEE Transactions on Electron Devices.

[11]  J. Meindl,et al.  Performance limits of E/D NMOS VLSI , 1980, 1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.

[12]  T. Mano,et al.  A 256K RAM fabricated with molybdenum-polysilicon technology , 1980, 1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.