Abstract The paper is devoted to an assessment of the mechanical behavior of hard and superhard nanocomposite coatings from loading/unloading curves measured by a computer-controlled Fischerscope H 100 microhardness tester and a maximum depth d max of the diamond indenter impression into the coating at a given load L . It is shown that: (1) the area between the loading/unloading curve and the value of d max decreases with increasing (i) hardness H , (ii) effective Young's modulus E * = E /(1−ν 2 ) and (iii) universal hardness HU, where E and ν are the Young's modulus and the Poisson ratio, respectively; and (2) there is no simple relation between the mechanical response of the coating and H or E * alone; however, this response is strongly dependent on the ratio H / E * . The last fact gives a possibility of tailoring the mechanical properties of a coating for a given application, e.g. to prepare coatings with high hardness H , high resistance to plastic deformation (∼ H 3 / E *2 ), high elastic recovery W e , but with low E * and high d max . Special attention is also given to the analysis of problems in accurately measuring the hardness of superhard (≥60 GPa) coatings. It is shown that a high elastic recovery W e ≥80% of superhard films with H ≥60 GPa (1) strongly decreases the gradient d H /d L and (2) shifts the region L , where H ( L )≈constant and the hardness H is correctly measured, to higher values of L . This means that the lowest load L used in the hardness measurement must be higher than L used in measurements of coatings with H H measured from being significantly higher than the real hardness of the coating.
[1]
J. Musil,et al.
Hard nanocomposite Zr-Y-N coatings, correlation between hardness and structure
,
2000
.
[2]
J. Kasl,et al.
Hard and superhard Zr–Ni–N nanocomposite films
,
2001
.
[3]
J. Musil,et al.
Formation of Ti1–xSix and Ti1–xSixN films by magnetron co-sputtering
,
1999
.
[4]
L. Hultman,et al.
Influence of residual stresses on the mechanical properties of TiCxN1-x (x = 0, 0.15, 0.45) thin films deposited by arc evaporation
,
2000
.
[5]
I. Ivanov,et al.
Stress development during deposition of CNx thin films
,
1998
.
[6]
S. Vepřek.
The search for novel, superhard materials
,
1999
.
[7]
H. Nanto,et al.
Elastic and plastic energies in sputtered multilayered Ti–TiN films estimated by nanoindentation
,
2000
.