A new linearity measurement algorithm for sub-micron microwave cmos

We have proposed a new extraction algorithm of linearity by optimizing measurement node interval, which provides noise-free VIP3 without significant detail loss. As a result, VIP3 can be easily derived satisfying one-percent error criterion. Stable VIP3 extraction can endow us with a powerful analysis tool for sub-micron microwave CMOS.

[1]  D.B.M. Klaassen,et al.  RF-distortion in deep-submicron CMOS technologies , 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

[2]  F. W. Kellaway,et al.  Advanced Engineering Mathematics , 1969, The Mathematical Gazette.

[3]  R. van Langevelde,et al.  RF-CMOS performance trends , 2001 .

[4]  David J. Frank,et al.  Nanoscale CMOS , 1999, Proc. IEEE.

[5]  T. Ohguro,et al.  Future perspective and scaling down roadmap for RF CMOS , 1999, 1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325).