论文信息 - Effects of Non-Stoichiometry on the Microstructure, Oxygen Vacancies, and Electrical Properties of KNN-Based Thin Films - 字舞流文

Effects of Non-Stoichiometry on the Microstructure, Oxygen Vacancies, and Electrical Properties of KNN-Based Thin Films

C. C. Chen | S. Chu | C. Weng | H. Su | J. Sheen | C. Lin | Cheng‐Che Tsai | Cheng‐Shong Hong | Z. Chen | S. Chu