Qualification methodology for sub-micron ICs at the Low Noise Underground Laboratory of Rustrel

Alpha contamination has become a major concern in ICs. To qualify packaging solutions for commercial, industrial, and aerospace/defense components, a program is described. The chosen methodology associates the use of real time testing in altitude and underground environments. Experiments are performed on Xilinx FPGAs. Goals, experiment design, statistical confidence, initial results are analyzed and discussed.

[1]  T. Ishizaki,et al.  Soft errors in SRAM devices induced by high energy neutrons, thermal neutrons and alpha particles , 2002, Digest. International Electron Devices Meeting,.

[2]  R. Edwards.  Technical specification for atmospheric radiation single event effects (SEE) on avionics electronics , 2005 .

[3]  D. Bloyet,et al.  First characterization of the ultra-shielded chamber in the low-noise underground laboratory (LSBB) of Rustrel-Pays d'Apt , 1999, astro-ph/9910192.

[4]  Robert C. Baumann,et al.  Neutron-induced 10B fission as a major source of soft errors in high density SRAMs , 2001, Microelectron. Reliab..

[5]  H.H.K. Tang,et al.  Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground , 2004, IEEE Transactions on Nuclear Science.

[6]  Jean-Yves Dauvignac,et al.  Ultra-wideband microwave imaging of heterogeneities , 2007 .

[7]  Michael S. Gordon,et al.  Alpha particle mitigation strategies to reduce chip soft error upsets , 2007 .

[8]  A. Lesea,et al.  The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs , 2005, IEEE Transactions on Device and Materials Reliability.

[9]  T. J. O'Gorman.  The effect of cosmic rays on the soft error rate of a DRAM at ground level , 1994 .

[10]  R. Baumann,et al.  Boron compounds as a dominant source of alpha particles in semiconductor devices , 1995, Proceedings of 1995 IEEE International Reliability Physics Symposium.

[11]  E. Normand.  Single event upset at ground level , 1996 .

[12]  B. M. Clark,et al.  Alpha radiation sources in low alpha materials and implications for low alpha materials refinement , 2004 .

[13]  N. A. Al-Mohawes,et al.  Determination of uranium and thorium concentrations in integrated circuit packaging materials , 1989 .

[14]  B Wiegel,et al.  NEMUS—the PTB Neutron Multisphere Spectrometer: Bonner spheres and more , 2002 .

[15]  James L. Walsh,et al.  Field testing for cosmic ray soft errors in semiconductor memories , 1996, IBM J. Res. Dev..

[16]  Lloyd W. Massengill,et al.  Cosmic and terrestrial single-event radiation effects in dynamic random access memories , 1996 .