论文信息 - Measurement and simulation of near field emissions from microstrip lines

Measurement and simulation of near field emissions from microstrip lines

This paper presents results from measurements and simulations of near field scans above a microstrip line on a FR4 dielectric substrate. It is found that, through careful probe calibration, good agreement between measurement and simulation can be obtained up to 1 GHz. Above 1 GHz differences appear some due to physical features that are poorly quantified, particularly the dielectric loss associated with the FR4 substrate.

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