Electro-optic systems research using the variable parameter FLIR

An efficient and cost-effective approach to electrooptic systems research is to investigate system concepts and sensor components on a generic testbed that can be readily modified for a variety of applications. The variable-parameter FLIT is a research and development testbed for evaluating systems concepts, testing sensor components, and providing benchmark data for model and figure-of-merit validations. The authors describe the variable parameter FLIR and show how it can be used in electrooptic system research by presenting an example of microscanned imagery. The results show the reduced aliasing associated with a microscanned system and illustrate how a systems approach can overcome the limitations of a single component.<<ETX>>