Simultaneous imaging of upset- and latchup-sensitive regions in a static RAM
暂无分享,去创建一个
J. Barak | J. Barak | E. Adler | S. Metzger | B. Fischer | M. Schlogl | E. Adler | M. Schlogl | B. E. Fischer | S Metzger
[1] F. W. Sexton,et al. Microbeam studies of single-event effects , 1996 .
[2] M. Hass,et al. A new approach to the analysis of SEU and SEL data to obtain the sensitive volume thickness [ICs] , 1995 .
[3] J. Ziegler,et al. stopping and range of ions in solids , 1985 .
[4] R. Harboe-Sørensen,et al. Heavy ion microscopy of single event upsets in CMOS SRAMs , 1994 .