Simplifying and interpreting two-tone measurements

We develop a mathematical description of the response of weakly nonlinear systems to second-order memory mechanisms. Our description is based on a time-varying gain-modulation function. We show that intermodulation (IM) products arising from interactions at baseband have phase symmetries different from both interactions at second harmonic frequencies and gain compression and, thus, may be readily distinguished through measurement. We also demonstrate a technique for measuring and aligning the phase of IM products outside the measurement bandwidth of our instrumentation to identify contributions to memory with broad frequency response.

[1]  Kate A. Remley,et al.  Phase detrending for measured multisine signals , 2003, 61st ARFTG Conference Digest, Spring 2003..

[2]  J. Verspecht,et al.  Calibrated vectorial nonlinear-network analyzers , 1994, 1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No.94CH3389-4).

[3]  J. Verspecht.  The return of the sampling frequency convertor , 2003, Conference, 2003. Fall 2003. 62nd ARFTG Microwave Measurements.

[4]  J. S. Kenney,et al.  Quantifying memory effects in RF power amplifiers , 2002 .

[5]  Timo Rahkonen,et al.  Measurement technique for characterizing memory effects in RF power amplifiers , 2001 .

[6]  C. Weitzel,et al.  RF power amplifiers for wireless communications , 2002, 24th Annual Technical Digest Gallium Arsenide Integrated Circuit (GaAs IC) Symposiu.

[7]  Stephen A. Maas,et al.  Nonlinear microwave circuits , 1988 .

[8]  M.B. Steer,et al.  A novel envelope-termination load-pull method for ACPR optimization of RF/microwave power amplifiers , 1998, 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192).

[9]  L.E. Larson,et al.  Augmented behavioral characterization for modeling the nonlinear response of power amplifiers , 2002, 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278).

[10]  Anthony E. Parker,et al.  Measurement and characterization of HEMT dynamics , 2000, 2000 Asia-Pacific Microwave Conference. Proceedings (Cat. No.00TH8522).

[11]  J. Wood,et al.  Extended NVNA bandwidth for long-term memory measurements , 2004, 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535).

[12]  Y. Rolain,et al.  Broadband measurement and identification of a Wiener-Hammerstein model for an RF amplifier , 2002, 60th ARFTG Conference Digest, Fall 2002..

[13]  P. Draxler,et al.  Time domain characterization of power amplifiers with memory effects , 2003, IEEE MTT-S International Microwave Symposium Digest, 2003.

[14]  Jeonghyeon Cha,et al.  Measurement of Memory Effect of High-Power Si LDMOSFET Amplifier Using Two-tone Phase Evaluation , 2001, 58th ARFTG Conference Digest.

[15]  C. J. Clark,et al.  Time-domain envelope measurement technique with application to wideband power amplifier modeling , 1998 .

[16]  Anthony E. Parker,et al.  Bias and frequency dependence of FET characteristics , 2003 .

[17]  Anthony E. Parker,et al.  Effect of baseband impedance on FET intermodulation , 2003 .

[18]  Christopher P. Silva,et al.  Introduction to Polyspectral Modeling and Compensation Techniques for Wideband Communications Systems , 2001, 58th ARFTG Conference Digest.

[19]  P.J. Tasker,et al.  A study of the effect of envelope impedance on intermodulation asymmetry using a two-tone time domain measurement system , 2002, 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278).

[20]  Jose C. Pedro,et al.  A comprehensive explanation of distortion sideband asymmetries , 2002 .

[21]  Joel Dunsmore,et al.  Novel Two-Tone Intermodulation Phase Measurement for Evaluating Amplifier Memory Effects , 2003, 2003 33rd European Microwave Conference, 2003.

[22]  J. Wood,et al.  Bias-dependent linear, scalable millimeter-wave FET model , 2000, IMS 2000.

[23]  V. Aparin,et al.  Effect of out-of-band terminations on intermodulation distortion in common-emitter circuits , 1999, 1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282).