Bayesian Control Chart for Nonconformities

The c-chart or the control chart for nonconformities is designed for the case where one deals with the number of defects or nonconformities observed. A control chart can be developed for the total or average number of nonconformities per unit, which is well modeled by the Poisson distribution. In this paper the c-chart will be studied, where the usual operation of the c-chart will be extended by introducing a Bayesian approach for the c-chart. Control chart limits, average run lengths, and false alarm rates will be determined by using a Bayesian method. These results will be compared with the results obtained when using the classical (frequentist) method. Copyright © 2014 John Wiley & Sons, Ltd.

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